3D IC
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Product Details
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SECTION 1: FUNCTIONAL ARCHITECTURE & CIRCUIT ROLE
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1. Direct Charge Pump Architecture (DSBGA-42):
- Schematic Reference: Typically labeled as U_CHARGER_2, U_DIRECT_CHG, or secondary fast charge controller on Samsung schematic diagrams.
- Dual-Charger Topology:
* Flagship Samsung phones utilize a dual-charging circuit architecture:
a) Primary PMIC / Charger (e.g., Maxim or Shannon PMIC): Handles standard 5V slow charging, wireless charging input, and low-battery recovery.
b) "3D" Direct Charger IC: Engages automatically when a genuine 25W / 45W Samsung Super Fast Charger (USB-PD PPS) is connected.
- Charge Pump (2:1 Converter) Mechanism:
* Instead of a large power inductor, the 3D IC utilizes high-frequency external "flying" ceramic capacitors connected to its switching terminals.
* It divides the incoming high-voltage PPS rail (e.g., 9.5V at 2.5A) by exactly half, outputting 4.75V at 5.0A directly onto the battery rail with minimal resistive heat generation.
- I2C / SPMI Interface: Connects directly to the Exynos or Snapdragon Application Processor to continuously negotiate voltage/current steps in 20mV / 50mA increments.
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SECTION 2: BOARD-LEVEL FAULT SYMPTOMS
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1. Super Fast Charging (25W / 45W) Failure:
- Device charges normally when connected to a standard 5V/2A charger (blue/green ring), but immediately fails, disconnects, or remains stuck at slow speed (5V/0.8A) when plugged into an original Samsung 25W/45W Type-C adapter.
- Root Cause: Failed "3D" charge-pump stage or cracked solder balls under the 42-ball BGA array preventing PPS handshake.
2. "Charging Paused / Battery Temperature Error":
- Phone displays a yellow triangle with a thermometer icon, stating "Charging paused: Battery temperature too high" even though the phone is completely cold.
- Root Cause: Damaged internal temperature-sensing ADC or shorted thermistor input lines inside the 3D IC.
3. Fake Charging (Percentage Does Not Advance):
- The charging lightning bolt appears, the battery percentage indicates charging, but the numerical value drops or stays at 1% over several hours.
- Root Cause: Blown internal current pass-FET restricting current delivery to under 0.05A.
4. 0.00A Current Draw / Intermittent Disconnection:
- The phone does not react when the Type-C cable is inserted, or connects and disconnects every 2 to 3 seconds.
- Root Cause: Blown Over-Voltage Protection (OVP) gate driver inside the 3D IC cutting off the VBUS supply line.
5. Instant Restart Upon Connecting Fast Charger:
- Phone runs smoothly on battery, but the exact second a Type-C fast charger is plugged in, the device instantly shuts down or enters a boot loop.
- Root Cause: Internal high-side FET punch-through creating an immediate transient short circuit on the system rail.
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SECTION 3: STEP-BY-STEP MULTIMETER TESTING & DIAGNOSTICS
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1. Cold Testing (Diode Mode Drop Readings in mV):
- Set digital multimeter to Diode Mode. Place the RED probe on motherboard ground (GND shield), and probe surrounding SMD test points with the BLACK probe:
* VBUS Input Line Capacitors: ~480 mV to 580 mV (0.000V indicates blown input protection capacitor or punctured 3D IC input gate).
* Flying Charge-Pump Capacitors (CF1 / CF2): Both sides should read balanced high diode drops (~500 mV to 650 mV to GND). A 0.000V reading across the capacitor indicates a ruptured internal capacitor switch.
* Output Line to Battery (VBAT): ~380 mV to 460 mV.
* I2C Communication Lines (SDA / SCL): ~520 mV to 680 mV on each line.
2. Hot Testing (With 25W Type-C Fast Charger Connected):
- Connect a genuine Samsung 25W PPS charger:
* Input Voltage Pin: Initially reads 5.0V, then immediately steps up to 9.0V–9.8V DC upon Super Fast Charge protocol handshake.
* If the input voltage collapses to 0V or remains locked at 5V while drawing 0.00A, the 3D IC has failed to communicate or has triggered hardware shutdown.
* Output to Battery Rail: Should supply 4.2V to 4.45V DC at full rated fast charging current (typically 2.0A to 3.5A on a USB Type-C tester).
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SECTION 4: SOLDERING, REBALLING & REWORK SPECIFICATIONS
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1. Desoldering Protocol:
- Hot Air Station: Quick 861DW, Atten ST-862D, or Sugon 8620DX.
- Temperature Setting: 330°C - 340°C.
- Airflow Setting: 25% - 30% with a fine 3.0mm straight nozzle.
- Thermal Protection: Mask nearby double-layer sandwich interposer joints, Exynos/Snapdragon CPU, and camera sockets with multiple layers of Kapton tape and heat-reflecting copper tape.
- Removal: Dispense high-grade no-clean tacky flux (Amtech NC-559-V2-TF). Apply uniform circular heat for 12-15 seconds until the BGA solder balls liquefy, then lift vertically with precision curved tweezers without sliding horizontally.
2. Footprint Cleaning & Preparation:
- Set soldering iron to 330°C using an ultra-fine knife tip.
- Add a small amount of Sn63/Pb37 leaded solder to blend with the factory lead-free alloy on the motherboard pads.
- Clean the 42-ball grid smoothly using a 0.8mm desoldering copper wick until all pads are completely flat. Clean residue thoroughly using 99.9% pure Isopropyl Alcohol (IPA).
3. Reballing the 3D IC:
- Insert the chip into a dedicated Samsung S20 / Note 10 series charging IC stencil (0.12mm thickness, matching the fine 42-ball pitch).
- Apply medium-temperature solder paste (Sn63/Pb37, 183°C melting point). Scrape away excess paste cleanly.
- Reflow with hot air at 250°C - 260°C with 15%-20% airflow until bright, uniform solder spheres form across all pads.
- Cool, wash with IPA, and inspect under a stereo microscope to ensure zero solder bridges or missing spheres.
4. Installation & Verification:
- Apply a microscopic, transparent smear of flux across the motherboard footprint.
- Carefully align the Pin 1 orientation dot on the 3D chip with the silkscreen guide dot on the board.
- Reflow at 320°C - 330°C at 25% airflow. Watch for the chip to drop into place and self-align via liquid solder surface tension.
- Apply an ultra-gentle micro-tweezer tap to confirm elastic return movement.
- Allow natural cooling for 3 minutes, clean flux residue with IPA, reassemble board, and verify "Super Fast Charging" operation on a Type-C power tester.
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